Bulk-like dielectric and magnetic properties of sub 100 nm thick single crystal Cr2O3 films on an epitaxial oxide electrode | Scientific Reports
Characterization of fiber texture by omega-scan x-ray diffraction. | Semantic Scholar
Omega/Theta XRD
Top 10 mistakes in X ray analysis - M Sardela - MRL - 08132020 - YouTube
Application of rocking-scan method to detect the low-content diamonds in a complex mixture - ScienceDirect
Omega-scan - Freiberg Instruments - lifetime, single crystal orientation, PID, automation and more
Reciprocal Space XRD Mapping with Varied Incident Angle as a Probe of Structure Variation within Surface Depth
XRD Phi Rotation Scanning | Materials Characterization Lab
PPT - Introduction to High Resolution X-Ray Diffraction of Epitaxial Thin Films PowerPoint Presentation - ID:1598900
Omega-scan - Freiberg Instruments - lifetime, single crystal orientation, PID, automation and more
High-Resolution X-ray Diffraction
Omega–Phi compensated GID in side inclination mode for measurement of residual stress in polycrystalline thin films | Powder Diffraction | Cambridge Core
Diffractometers - an overview | ScienceDirect Topics
Omega-scan - Freiberg Instruments - lifetime, single crystal orientation, PID, automation and more
Low pressure chemical vapor deposition high temperature growth of β-Ga2O3 on Si and C face 4H-SiC - American Chemical Society
X-ray for characterization of thin films
Wide-Angle X-ray Diffraction Evidence of Structural Coherence in CsPbBr3 Nanocrystal Superlattices | ACS Materials Letters
A novel high-resolution XRD apparatus for patterned epitaxial films in a 50pm pad area with a convergent micro X-ray beam
Thin Film Analysis
